Power spectrum analysis for defect screening in integrated circuit devices [electronic resource]

• Ngôn ngữ: eng
• Ký hiệu phân loại: 621.3815 Electrical, magnetic, optical, communications, computer engineering; electronics, lighting
• Thông tin xuất bản: Albuquerque, N.M. : Oak Ridge, Tenn. : Sandia National Laboratories. ; Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2011
• Mô tả vật lý: Medium: ED : , digital, PDF file.
• Bộ sưu tập: Metadata
• ID: 256839
• Chủ đề: 1. 30 direct energy conversion

Tóm tắt

A device sample is screened for defects using its power spectrum in response to a dynamic stimulus. The device sample receives a time-varying electrical signal. The power spectrum of the device sample is measured at one of the pins of the device sample. A defect in the device sample can be identified based on results of comparing the power spectrum with one or more power spectra of the device that have a known defect status.