Silicon Damage Response Function Derivation and Verification [electronic resource] : Assessment of Impact on ASTM Standard E722

• Ngôn ngữ: eng
• Ký hiệu phân loại: 620 Engineering and allied operations
• Thông tin xuất bản: Washington, D.C. : Oak Ridge, Tenn. : United States. National Nuclear Security Administration ; Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2016
• Mô tả vật lý: Size: 39 p. : , digital, PDF file.
• Bộ sưu tập: Metadata
• ID: 268130
• Chủ đề: 1. 36 materials science; 2. 73 nuclear physics and radiation physics; 3. 97 mathematics and computing; 4. Response functions; 5. Silicon

Tóm tắt

Unsuccessful attempts by members of the radiation effects community to independently derive the Norgett-Robinson-Torrens (NRT) damage energy factors for silicon in ASTM standard E722-14 led to an investigation of the software coding and data that produced those damage energy factors. The ad hoc collaboration to discover the reason for lack of agreement revealed a coding error and resulted in a report documenting the methodology to produce the response function for the standard. The recommended changes in the NRT damage energy factors for silicon are shown to have significant impact for a narrow energy region of the 1-MeV(Si) equivalent fluence response function. However, when evaluating integral metrics over all neutrons energies in various spectra important to the SNL electronics testing community, the change in the response results in a small decrease in the total 1- MeV(Si) equivalent fluence of ~0.6% compared to the E722-14 response. Response functions based on the newly recommended NRT damage energy factors have been produced and are available for users of both the NuGET and MCNP codes.